DocumentCode :
3315656
Title :
High quality artifact-free super-resolution
Author :
Zhang, Wei ; Cham, Wai-Kuen
Author_Institution :
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Shatin, China
fYear :
2010
fDate :
26-29 Sept. 2010
Firstpage :
889
Lastpage :
892
Abstract :
Blurring and jaggy artifacts are the primal culprits that plague the current super-resolution techniques. In this paper, we propose a simple but effective approach which is capable of producing a pleasant artifact-free high-resolution image from a single low-resolution input. Specifically, we first magnify the low-resolution image to the desired resolution through structure adaptive interpolation to avoid jaggies. Then a salient edge directed deblurring scheme is introduced to remove the blurriness of the magnified image. Unlike previous work, we advocate solving the deblurring problem in an efficient manner with the aid of little user intervention. Our study shows that the blurring kernel can be estimated fairly well from the salient edges selected with user-drawn stroke based on a parametric edge model. Experiments are conducted to validate the effectiveness of the proposed method.
Keywords :
image resolution; image restoration; interpolation; artifact-free high resolution image; high quality artifact-free super resolution; jaggy artifact; parametric edge model; salient edge directed deblurring; structure adaptive interpolation; super resolution technique; user-drawn stroke; Estimation; Image edge detection; Image resolution; Interpolation; Kernel; Pixel; Strontium; Super-resolution; deblurring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
ISSN :
1522-4880
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2010.5650413
Filename :
5650413
Link To Document :
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