DocumentCode
3315910
Title
Thermal annealing action on plastic deformation of submicrocrystalline alpha-iron
Author
Son, A.
Author_Institution
Tomsk Polytech. Inst., Russia
fYear
2003
fDate
7-11 April 2003
Firstpage
190
Lastpage
192
Abstract
The unique physical and chemical, mechanical properties of nano- and submicrocrystalline materials are due to such factors as the small size of grains, defective structure of the grains boundaries, high level of the internal stresses, microstrainings of crystal lattice, and high density of grain-boundary dislocations. This paper considers the structure, mechanical characteristics and the peculiarities of plastic flow of SMC Armco-iron subjected to thermal annealing at different temperatures. Structural investigations were performed by the methods of translucent electron microscopy (TEM). Investigation of straining relief showed that regardless of the mode and the quantity of passages in even-channel angular pressing the samples of SMC alpha-Fe have high tendency to the straining localization. Mechanical properties of the investigated samples are determined by the mode of ECAP. Thermal annealing of the samples of SMC alpha-Fe allows one to change their mechanical characteristics within wide ranges.
Keywords
annealing; dislocations; grain boundaries; internal stresses; nanostructured materials; plastic deformation; transmission electron microscopy; crystal lattice microstraining; grain-boundary dislocations; internal stresses; mechanical properties; nanocrystalline materials; plastic deformation; submicrocrystalline alpha-iron; submicrocrystalline materials; thermal annealing; translucent electron microscopy; Annealing; Chemicals; Crystalline materials; Grain boundaries; Internal stresses; Lattices; Mechanical factors; Nanostructured materials; Plastics; Sliding mode control;
fLanguage
English
Publisher
ieee
Conference_Titel
Modern Techniques and Technologies, 2003. MTT 2003. Proceedings of the 9th International Scientific and Practical Conference of Students, Post-graduates and Young Scientists
Conference_Location
Tomsk
Print_ISBN
0-7803-7669-2
Type
conf
DOI
10.1109/SPCMTT.2003.1438189
Filename
1438189
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