• DocumentCode
    3316114
  • Title

    Serialized TID numbers - A headache or a blessing for RFID crackers?

  • Author

    Lehtonen, Mikko ; Ruhanen, Antti ; Michahelles, Florian ; Fleisch, Elgar

  • Author_Institution
    Inf. Manage., ETH Zurich, Zurich
  • fYear
    2009
  • fDate
    27-28 April 2009
  • Firstpage
    233
  • Lastpage
    240
  • Abstract
    Though transponder ID (TID) numbers of RFID tags were originally introduced to identify the chip model, serialized TID numbers are currently advertised as security features of UHF chips. Serialized TID numbers do not provide any cryptographic protection, but they do introduce a practical hurdle against adversaries who want to clone RFID tags today. Furthermore, serialized TID numbers are important for end-users who want to protect their current UHF tags from cloning since cryptographic tags are not yet commercially available in that frequency range. In this overview paper, we analyze the suitability of serialized TID numbers for security applications by evaluating the effort to bypass the TID check based on known vulnerabilities and we compare this effort to the needed level of protection in an example of anti-counterfeiting in the tobacco industry. The analysis illustrates that the practical hurdle of TID checks is not high enough for industrial-scale security applications and that it can completely diminish due to commodification of the RFID technology. However, end-users of security applications can still benefit from the increased tag cloning resistance that serialized TID numbers provide before migrating to more secure solutions.
  • Keywords
    radiofrequency identification; transponders; RFID crackers; TID numbers; chip model; cryptographic protection; radio frequency identification; transponder ID; Business; Counterfeiting; Cryptographic protocols; Cryptography; Frequency; Hardware; Microcontrollers; Radiofrequency identification; Security; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    RFID, 2009 IEEE International Conference on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4244-3337-7
  • Electronic_ISBN
    978-1-4244-3338-4
  • Type

    conf

  • DOI
    10.1109/RFID.2009.4911183
  • Filename
    4911183