Simulated Annealing with Fuzzy Fitness Function for Test Frequencies Selection

Author

Grzechca, Damian ; Golonek, Tomasz ; Rutkowski, Jerzy

Author_Institution

Silesian Univ. of Technol., Gliwice

fYear

2007

fDate

23-26 July 2007

Firstpage

1

Lastpage

6

Abstract

This paper discusses the optimization of input source frequencies to obtain the highest detection and location rate of a circuit under test. The minimum number of frequencies for distinguishes between fault and fault free elements are desired. We briefly describe the basic concepts of simulated annealing method and fuzzy evaluation (fitness) system. Presented application shows how to code the optimization problem. It has been compared algorithm with fuzzy goal function and weighted goal function. Obtained results are attached and discussed.

Keywords

circuit testing; fault diagnosis; fuzzy set theory; logic testing; simulated annealing; circuit testing; fault free element; fuzzy evaluation system; fuzzy fitness function; input source frequency optimization; simulated annealing; test frequency selection; Circuit faults; Circuit simulation; Circuit testing; Current measurement; Electronic circuits; Fault diagnosis; Frequency; Fuzzy systems; Performance evaluation; Simulated annealing;

fLanguage

English

Publisher

ieee

Conference_Titel

Fuzzy Systems Conference, 2007. FUZZ-IEEE 2007. IEEE International

Conference_Location

London

ISSN

1098-7584

Print_ISBN

1-4244-1209-9

Electronic_ISBN

1098-7584

Type

conf

DOI

10.1109/FUZZY.2007.4295406

Filename

4295406