Title :
Average probability of packet error with MRC diversity reception over arbitrarily correlated fading channels
Author :
Digham, Fadel F. ; Alouini, Mohamed-Slim
Author_Institution :
Dept. of Electr. & Comput. Eng., Minnesota Univ., USA
Abstract :
A closed form expression for the average probability of packet error (PPE) is presented for a maximum ratio combining (MRC) diversity scheme. The resulting expression encompasses arbitrarily correlated Nakagami and Rician fading channels. As an example, we focus on Nakagami fading channels of arbitrary correlation in both time and space. The new formulas are applicable for all modulation schemes for which the conditional probability of error has an exponential dependence on the signal-to-noise ratio (SNR). The average PPE is then used to obtain a modified expression for the throughput of any network protocol. The system in general exhibits approximately a uniform gain as the number of diversity branches increases. The system is found to be more sensitive to the space correlation than to the time correlation. The effects of different system parameters and correlation models are studied and discussed. Specific figures about the system performance are provided.
Keywords :
Rician channels; correlation theory; diversity reception; error statistics; mobile radio; modulation; packet radio networks; protocols; telecommunication traffic; MRC diversity reception; Nakagami fading channels; Rician fading channels; SNR; arbitrarily correlated fading channels; average packet error probability; closed form expression; conditional error probability; diversity branches; maximum ratio combining; modulation schemes; network protocol; signal-to-noise ratio; space correlation; system performance; throughput; time correlation; uniform gain; Access protocols; Computer errors; Diversity methods; Diversity reception; Fading; Rician channels; Signal to noise ratio; System performance; Throughput; Wireless sensor networks;
Conference_Titel :
Global Telecommunications Conference, 2002. GLOBECOM '02. IEEE
Print_ISBN :
0-7803-7632-3
DOI :
10.1109/GLOCOM.2002.1188433