• DocumentCode
    3316470
  • Title

    Theoretical studies of current transport in interband tunnel structures using the effective bond orbital model

  • Author

    Ting, D.Z.-Y. ; Yu, E.T. ; MgGill, T.C.

  • Author_Institution
    Lab. of Appl. Phys., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    1990
  • fDate
    9-12 Dec. 1990
  • Firstpage
    779
  • Lastpage
    782
  • Abstract
    A model has been developed that incorporates realistic band structure calculations to describe carrier transport in interband tunnel structures based on the InAs/GaSb/AlSb material system. The light-hole, heavy-hole, and split-off valence bands, and the lowest conduction band, have been incorporated using the effective bond orbital model. The results of the present calculations are compared with those obtained using a two-band model in which only the lowest conduction band and the light-hole valence band have been included. It is found that heavy-hole states can introduce substantial hole-mixing effects in device structures containing GaSb valence-band quantum wells, and could have a significant influence on the current-voltage characteristics of interband devices.<>
  • Keywords
    III-V semiconductors; band structure of crystalline semiconductors and insulators; gallium compounds; indium compounds; semiconductor device models; semiconductor junctions; tunnelling; GaSb-InAs-GaSb; InAs-GaSb-InAs; band structure; carrier transport; conduction band; current transport; current-voltage characteristics; device structures; effective bond orbital model; heavy hole valence bands; hole-mixing effects; interband tunnel structures; light hole valence bands; split-off valence bands; Bonding; Conducting materials; Current-voltage characteristics; Orbital calculations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1990.237045
  • Filename
    237045