Title :
Measurements of electron-RF interactions and noise in a low frequency crossed-field amplifier
Author :
Browning, Jim ; Chan, Chi Hou ; Ye, John
Author_Institution :
Center for Electromagnetics Res., Northeastern Univ., Boston, MA, USA
Abstract :
A low-frequency (100 to 200 MHz), low-power crossed-field amplifier has been constructed for studying nonlinear RF-wave-electron interactions, for investigating noise mechanisms, and for verifying numerical simulations by using in situ diagnostics during amplification. Operating in the injected-beam mode, the device has achieved gain as high as 7 dB at 150 MHz with a 10 W drive. Measurements of the local RF field in two dimensions show gain in the local field at the output end of the circuit. Measurements of the electron density profile verify the predicted cycloidal beam pattern, and measurements during amplification show local electron density increases near the anode. Measurements of the noise using an RF probe indicate noise generation during secondary electron emission from the sole.<>
Keywords :
electron device noise; electron-wave tubes; radiofrequency amplifiers; 10 W; 100 to 200 MHz; 7 dB; RF probe; amplification; crossed-field amplifier; cycloidal beam pattern; electron density profile; electron-RF interactions; injected-beam mode; local RF field; low frequency; low-power; nonreentrant tube; secondary electron emission; Charge carrier processes; Circuit noise; Density measurement; Electron beams; Low-frequency noise; Low-noise amplifiers; Noise generators; Noise measurement; Numerical simulation; Radio frequency;
Conference_Titel :
Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/IEDM.1990.237050