DocumentCode :
3316701
Title :
HSST BiCMOS technology with 26 ps ECL and 45 ps 2 V CMOS inverter
Author :
Konaka, Shinsuke ; Kobayashi, Toshio ; Matsuda, Tadahito ; Ugajin, Mamoru ; Imai, Kazuo ; Sakai, Tetsushi
Author_Institution :
NTT, Kanagawa, Japan
fYear :
1990
fDate :
9-12 Dec. 1990
Firstpage :
493
Lastpage :
496
Abstract :
HSST/BiCMOS technology has been developed by merging a novel 0.3 mu m self-aligned double-poly bipolar process called high-performance super self-aligned process technology (HSST) and the 0.22 mu m CMOS process. The HSST bipolar transistor size is 2.5 times smaller than that of 1 mu m SST-1B with an emitter 0.4 mu m wide. This results from a 0.3 mu m design rule, a collector polysilicon trench electrode, and oxide-filled trench isolation. Owing to the horizontal shrinking and high cutoff frequency of 22.3 GHz at V/sub ce/=1 V, the ECL (emitter coupled logic) gate attains 25.4 ps/G at 1.58 mA. For the 0.2 mu m CMOS inverter, gate delays of 44.5 ps/G at V/sub dd/=2 V and 32.8 ps/G at 3 V are obtained. The BiCMOS gate also operates up to 116 ps/G at 2 V, 66.1 ps/G at 3 V, and 52.1 ps/G at 4 V.<>
Keywords :
BIMOS integrated circuits; emitter-coupled logic; integrated circuit technology; integrated logic circuits; 0.2 to 0.4 micron; 0.3 micron; 2 to 4 V; 32.8 to 116 ps; BiCMOS technology; CMOS inverter; ECL gate; HSST; collector polysilicon trench electrode; double-poly bipolar process; emitter coupled logic; high-performance super self-aligned process technology; oxide-filled trench isolation; polycrystalline Si; BiCMOS integrated circuits; Bipolar transistors; CMOS process; CMOS technology; Cutoff frequency; Electrodes; Inverters; Isolation technology; Logic gates; Merging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.1990.237060
Filename :
237060
Link To Document :
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