• DocumentCode
    3316784
  • Title

    A model based on information entropy to measure developer turnover risk on software project

  • Author

    Rong, Jiang ; Hongzhi, Liao ; Jiankun, Yu ; Tao, Feng ; Chenggui, Zhao ; Junlin, Li

  • Author_Institution
    Sch. of Inf., Yunnan Univ. of Finance & Econ., Kunming, China
  • fYear
    2009
  • fDate
    8-11 Aug. 2009
  • Firstpage
    419
  • Lastpage
    422
  • Abstract
    Risk can conduce to failure of software project, and make a loss for the enterprise. It is a focus topic for software engineering researchers. Developer turnover risk is a great risk at the process of software project, yet, few scholars pay attention to it. We can use information entropy to measure effectively the uniformity of each subsystem. In this paper, we provided a quantitative measure model based on information entropy to measure developer turnover risk on software project. The more uniformly developers influence the project, the smaller the risk is. Otherwise, the core developer turnover will make a huge fluctuation to the project. We not only have analyzed the model rationality, but have provided a model case. And the data required in the model can be got in the company. The model is scientific and reasonable, which has been indicated in practice, and can be used as basis to control the turnover risk.
  • Keywords
    entropy; project management; risk management; software engineering; software management; developer turnover risk; information entropy; quantitative measure model; software engineering researcher; software project; Companies; Costs; Finance; Fluctuations; Information entropy; Software engineering; Software maintenance; Software measurement; Software quality; Statistics; Developer Turnover; Dissipative Structure; Information Entropy; Risk Measure; Software Engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Technology, 2009. ICCSIT 2009. 2nd IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4519-6
  • Electronic_ISBN
    978-1-4244-4520-2
  • Type

    conf

  • DOI
    10.1109/ICCSIT.2009.5234813
  • Filename
    5234813