Title :
Perspective on device modelling and simulation in an optoelectronics fab
Author :
Jones, Stephen K. ; Ward, Andrew J. ; Bazley, David J. ; Knight, Ian G.
Author_Institution :
Bookham Technol. plc, Towcester
Abstract :
An overview of modeling and simulation in the context of chip development and manufacture in an optoelectronics semiconductor fab is presented.
Keywords :
integrated optoelectronics; semiconductor device manufacture; semiconductor device models; chip development; device modelling; device simulation; optoelectronics semiconductor fab; Analytical models; Calibration; Computational modeling; Context modeling; Electromagnetic modeling; Laser modes; Semiconductor device manufacture; Semiconductor process modeling; Stress measurement; Virtual manufacturing;
Conference_Titel :
Numerical Simulation of Optoelectronic Devices, 2008. NUSOD '08. International Conference on
Conference_Location :
Nottingham
Print_ISBN :
978-1-4244-2307-1
DOI :
10.1109/NUSOD.2008.4668217
