• DocumentCode
    3316932
  • Title

    Pose invariant robust facial expression analysis

  • Author

    Win, Khin Thu Zar ; Chen, Fan ; Izawa, Junko ; Kotani, Kazunori

  • Author_Institution
    Grad. Sch. of Inf. Sci., Japan Adv. Inst. of Sci. & Technol., Ishikawa, Japan
  • fYear
    2010
  • fDate
    26-29 Sept. 2010
  • Firstpage
    3837
  • Lastpage
    3840
  • Abstract
    This paper describes two novel facial expression recognition methods which are robust for head rotation within a certain angle range between -30 degrees and +30 degrees. We had proposed Eigenspace Method based on Class features of object (EMC) and Multiple Discriminant Analysis (MDA) for facial expression recognition. Our new methods, pEMC (parametric Eigenspace Method based on Class Features) and pMDA (parametric Multiple Discriminant Analysis), are extensions of EMC and MDA by using the parametric eigenspace technique. The parametric technique finds the manifold vector for recognition of rotated objects. Since EMC and MDA have the higher class separation, our new methods have both characteristics of parametric eigenspace and high classification of facial expression. pEMC and pMDA provide more 20 degree correct recognition than EMC regardless of the head pose.
  • Keywords
    face recognition; image classification; object recognition; pose estimation; vectors; class features; class separation; facial expression classification; facial expression recognition method; manifold vector; parametric eigenspace method; parametric multiple discriminant analysis; pose invariant robust facial expression analysis; rotated object recognition; Accuracy; Electromagnetic compatibility; Face; Face recognition; Manifolds; Training; Facial expression analysis; eigenspace method based on class features; multiple discriminant analysis; parametric eigenspace method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2010 17th IEEE International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-7992-4
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2010.5650484
  • Filename
    5650484