DocumentCode :
3317151
Title :
Computer based modeling for predicting reliability of flip-chip components on printed circuit boards
Author :
Bailey, Chris ; Lu, Hua ; Wheeler, Daniel
Author_Institution :
Centre for Numerical Modelling & Process Analysis, Greenwich Univ., London, UK
fYear :
1999
fDate :
1999
Firstpage :
42
Lastpage :
49
Abstract :
Flip-chip technology, developed in the early 1960s, is being positioned as a key joining technology to achieve high-density low profile mounting of electronic components on printed circuit boards (PCBs). At present, a process route that enables integration of this technology into standard assembly processes does not exist. Therefore, flip-chip technology is currently restricted to low volume products. This paper describes modelling technology and its use in providing data governing both the assembly and subsequent reliability of flip-chip components. Stress predictions, using finite element calculations, have been undertaken by a number of groups to predict thermal stress and fatigue in solder joints for a number of components. These simulations generally assume that the solder material starts in a stress free state, where defects arising during the reflow process are avoided. At present, very little has been published on the formation of solder joints during the reflow process, where integrated models for solidification and stress are required. This paper provides details on these models and how they are being used to identify suitable stand-off heights and process conditions for small pitch flip-chip assembly on FR4 substrates
Keywords :
chip-on-board packaging; circuit analysis computing; fatigue; fine-pitch technology; finite element analysis; flip-chip devices; integrated circuit modelling; integrated circuit packaging; integrated circuit reliability; microassembling; reflow soldering; solidification; stress analysis; thermal stresses; FR4 substrates; PCBs; assembly; assembly processes; computer based modeling; electronic components; fatigue; fine pitch flip-chip assembly; finite element calculations; flip-chip components; flip-chip on board; flip-chip technology; high-density low profile mounting; integrated models; modelling technology; printed circuit boards; process conditions; reflow process; reflow process defects; reliability; reliability prediction; simulation; solder joint formation; solder joints; solder material; solidification models; stand-off height; stress free state; stress models; stress prediction; thermal stress; Assembly; Electronic components; Fatigue; Finite element methods; Integrated circuit reliability; Predictive models; Printed circuits; Semiconductor device modeling; Soldering; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1999. Twenty-Fourth IEEE/CPMT
Conference_Location :
Austin, TX
ISSN :
1089-8190
Print_ISBN :
0-7803-5502-4
Type :
conf
DOI :
10.1109/IEMT.1999.804794
Filename :
804794
Link To Document :
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