• DocumentCode
    3317214
  • Title

    Emerging needs for continuous flow FOUP transport

  • Author

    Brain, Michael ; Gould, Richard ; Kaempf, Ulrich ; Wehrung, Brian

  • Author_Institution
    Palo Alto Technol. Inc., CA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    76
  • Lastpage
    82
  • Abstract
    The transition to 300 mm wafers places new demands on material handling. Most significantly, wafers will be transported and stored in front opening unified pods (FOUP), and process tools will be fitted with SMIF ports to transfer wafers in and out of pods without exposure to the fab environment. A 25-wafer pod can weigh over 8 kg, and for economic and ergonomic reasons can no longer be carried by operators. Hoists and other robotic devices will transfer pods between the tool load ports and new overhead or floor-based automated material handling systems (AMHS). In addition to the increased weight, 300 mm pod volume is more than twice the volume of a 200 mm pod, doubling the space required to store an equivalent number of pods. Zero footprint overhead storage allows wafer lots to be kept close to the process tools and prevents an undesirable burden on floor-space required by stockers. Such local buffers shorten the arrival time and increase tool utilization, which can have significant financial impact. Another emerging trend is distribution of certain process steps to locations remote from the main fab, requiring a high capacity point-to-point pod transport suitable for penetrating firewalls and passing along nonclean areas. This paper defines emerging fab requirements, then explores the different AMHS technologies and how they best fit specific tasks. A relatively new concept for pod handling, continuous flow transport (CFT) is presented. The authors show how this concept can meet pod handling requirements, including high volume transport and zero-footprint buffering near tools. Typical AMHS configurations and CFT performance data are shown
  • Keywords
    environmental degradation; hoists; integrated circuit manufacture; materials handling; surface contamination; AMHS; AMHS configurations; AMHS technologies; CFT performance data; FOUP; SMIF ports; arrival time; automated material handling systems; continuous flow FOUP transport; continuous flow transport; fab environment exposure; fab requirements; firewall penetration; floor-based automated material handling systems; front opening unified pods; hoists; local buffers; material handling; nonclean areas; overhead automated material handling systems; pod handling; pod storage space; pod transfer; pod volume; point-to-point pod transport; process step distribution; process tools; robotic devices; tool load ports; tool utilization; volume transport; wafer lots; wafer size; wafer storage; wafer transfer; wafer transport; zero footprint overhead storage; zero-footprint buffering; Biographies; Design automation; Educational institutions; Engineering management; Engineering profession; Isolation technology; Materials handling; Research and development management; Retirement; Technology management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1999. Twenty-Fourth IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-5502-4
  • Type

    conf

  • DOI
    10.1109/IEMT.1999.804799
  • Filename
    804799