Title :
An experimental study of fatigue strength characteristics of beam lead material in μBGA package
Author :
Park, Jun-Hyub ; Lee, Hyouk ; Moon, Ho Jeong ; Oh, Se Yong
Author_Institution :
Samsung Electron., Asan City, South Korea
Abstract :
Summary form only given. Thermal fatigue cracking in a beam lead in μBGA, a type of CSP (chip scale package), is identified as a major failure mode under a cyclic thermal loading environment. Accurate understanding of the parameters affecting the fatigue behavior of a beam lead is thus crucial to ensure the fatigue endurance of μBGAs. The main purpose of this study is to investigate the fatigue strength and behavior of the beam lead, which consists of an Au thin film-coated Cu core under mechanical loading conditions as an accelerated test condition. Fatigue tests under displacement control mode are carried out with Cu foil (18 μm thick) and Au coated Cu foil (20 μm thick) specimens to assess the effect of Au film on the fatigue life of the beam lead. To impose a mechanical load on a beam lead, we have developed a micro-mechanical testing machine which enables the low-cycle fatigue test of a beam lead. Tests are carried out under tensile loading conditions. From the experimental results, we obtained the curves for strain vs. fatigue life of Cu foils and Au coated Cu foil specimens. Comparisons between fatigue behavior of Cu foils and Au coated Cu foils are also made. The experimental results are compared with the fatigue life of beam leads in a fully assembled μBGA under the temperature cycling test condition
Keywords :
ball grid arrays; chip scale packaging; copper; failure analysis; fatigue testing; gold; integrated circuit interconnections; integrated circuit reliability; integrated circuit testing; life testing; micromechanical devices; tensile testing; test equipment; thermal stress cracking; 18 micron; 20 micron; Au coated Cu foils; Au film effect; Au thin film-coated Cu core; Au-Cu; CSP; Cu foils; accelerated test condition; assembled microBGA; beam lead; beam lead material; chip scale package; cyclic thermal loading environment; displacement control mode tests; failure mode; fatigue behavior; fatigue endurance; fatigue life; fatigue strength; fatigue tests; low-cycle fatigue test; mechanical load; mechanical loading conditions; micro-mechanical testing machine; microBGA package; strain/fatigue life curves; temperature cycling test condition; tensile loading conditions; thermal fatigue cracking; Assembly; Capacitive sensors; Chip scale packaging; Displacement control; Fatigue; Gold; Life estimation; Life testing; Particle beams; Thermal loading;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1999. Twenty-Fourth IEEE/CPMT
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-5502-4
DOI :
10.1109/IEMT.1999.804823