DocumentCode
3317814
Title
SIFT features for face recognition
Author
Geng, Cong ; Jiang, Xudong
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2009
fDate
8-11 Aug. 2009
Firstpage
598
Lastpage
602
Abstract
Scale invariant feature transform (SIFT) has shown to be very powerful for general object detection/recognition. And recently, it has been applied in face recognition. However, the original SIFT algorithm may not be optimal for analyzing face images. In this paper, we analyze the performance of SIFT and study its deficiencies when applied to face recognition. We propose two new approaches: Keypoints-Preserving-SIFT (KPSIFT) which keeps all the initial keypoints as features and Partial-Descriptor-SIFT (PDSIFT) where keypoints detected at large scale and near face boundaries are described by a partial descriptor. Furthermore, we compare the performances of holistic approaches: Fisherface (FLDA), the null space approach (NLDA) and Eigenfeature Regularization and Extraction (ERE) with feature based approaches: SIFT, KPSIFT and PDSIFT. Experimental results on ORL and AR databases show that our proposed approaches KPSIFT and PDSIFT can achieve better performance than the original SIFT. Moreover, the performance of PDSIFT is significantly better than FLDA and NLDA. And PDSIFT can achieve the same or better performance than the most successful holistic approach ERE.
Keywords
eigenvalues and eigenfunctions; face recognition; object detection; transforms; AR databases; Fisherface; eigenfeature regularization and extraction; face images; face recognition; null space approach; object detection; object recognition; partial-descriptor-SIFT; scale invariant feature transform; Algorithm design and analysis; Face detection; Face recognition; Feature extraction; Image analysis; Large-scale systems; Null space; Object detection; Performance analysis; Spatial databases; SIFT; face recognition; feature; holistic;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Science and Information Technology, 2009. ICCSIT 2009. 2nd IEEE International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-4519-6
Electronic_ISBN
978-1-4244-4520-2
Type
conf
DOI
10.1109/ICCSIT.2009.5234877
Filename
5234877
Link To Document