DocumentCode :
3317850
Title :
A 14-bit 1.0-GS/s dynamic element matching DAC with >80 dB SFDR up to the Nyquist
Author :
Jianan Liu ; Xueqing Li ; Qi Wei ; Huazhong Yang
Author_Institution :
Tsinghua Nat. Lab. for Inf. Sci. & Technol., Tsinghua Univ., Beijing, China
fYear :
2015
fDate :
24-27 May 2015
Firstpage :
1026
Lastpage :
1029
Abstract :
A 14-bit 1.0-GS/s current-steering digital-to-analog converter (DAC) was designed in a 65-nm CMOS process. For such current-steering DACs with a high sampling rate, the code-dependent load variations and switching glitches are a main bottleneck which limits the spurious-free dynamic range (SFDR). Dynamic element matching (DEM) has been an effective solution to randomize these glitches for a higher SFDR and also to reduce the matching requirement of the current cells for an area-efficient design which also improves the SFDR with reduced parasitic capacitance. An effective method named TRI-DEMRZ is proposed in this paper, consisting of time-relaxed interleaving, DEM and return-to-zero encoding. We also apply TRI-DEMRZ in synergy with complementary switched current sources (CSCS) to design the DAC for the purpose of a small die size and enhanced SFDR performance. Post-layout simulations show >80 dB SFDR up to the Nyquist. This DAC has a mixed 1.2 V / 2.5 V power supply and an active area of 0.48 mm2.
Keywords :
CMOS integrated circuits; digital-analogue conversion; 65-nm CMOS process; CSCS; DEM; SFDR; TRI-DEMRZ; code-dependent load variations; complementary switched current sources; digital-to-analog converter; dynamic element matching DAC; parasitic capacitance; return-to-zero encoding; spurious-free dynamic range; time-relaxed interleaving; CMOS integrated circuits; Decoding; Finite element analysis; Impedance; Load management; Switches; Transistors; Digital-to-analog converter (DAC); Dynamic element matching (DEM); mismatch; return-to-zero (RZ); spurious-free dynamic range (SFDR);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
Type :
conf
DOI :
10.1109/ISCAS.2015.7168811
Filename :
7168811
Link To Document :
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