• DocumentCode
    3317870
  • Title

    A bumping process for 12" wafers

  • Author

    Oppert, Thomas ; Teutsch, Thorsten ; Zakel, Eke ; Tovar, David

  • Author_Institution
    Packaging Technol. GmbH, Germany
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    328
  • Lastpage
    333
  • Abstract
    Flip chip (FC) technology is a driving force to achieve increased speed and performance along with higher I/O counts due to its high level of importance for a variety of applications. A breakthrough, however, will be the use of flip chip due to cost reduction. For this aim, it is essential to use low cost bumping techniques. This paper shows a low cost wafer level bumping process based on a electroless nickel/gold under bump metallization (UBM) for all flip chip interconnection technologies, such as flip chip on board or flip chip in package which are used in industry at present. The compatibility of electroless nickel bumping for implementation in wafer manufacturing in the next millennium shows that this is a key technology, not only for wafer technologies in use at present, but especially for the next generation wafer technologies which include 300 mm wafers and copper pads. A state of the art overview, and a roadmap to future developments in the semiconductor industry based on 300 mm wafers is shown
  • Keywords
    chip-on-board packaging; electroless deposition; flip-chip devices; gold; integrated circuit interconnections; integrated circuit metallisation; integrated circuit packaging; nickel; 12 in; 300 mm; Cu; I/O count; Ni-Au; bumping process; bumping techniques; copper pads; cost reduction; electroless nickel bumping; electroless nickel/gold under bump metallization; flip chip; flip chip in package; flip chip interconnection technology; flip chip on board; flip chip technology; semiconductor industry roadmap; wafer level bumping process; wafer manufacturing compatibility; wafer size; wafers; Copper; Costs; Flip chip; Gold; Manufacturing industries; Metallization; Metals industry; Nickel; Packaging; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1999. Twenty-Fourth IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-5502-4
  • Type

    conf

  • DOI
    10.1109/IEMT.1999.804841
  • Filename
    804841