DocumentCode :
3317904
Title :
High density ceramic chip carrier: a 50 ohm impedance solution with a 2× increase in wiring density for flip chip applications
Author :
Gupta, D. ; Humenik, J.N. ; Knickerbocker, J.U. ; O´Connor, D.P. ; O´Lery, P.
Author_Institution :
Interconnect Products, IBM Corp., Hopewell Junction, NY, USA
fYear :
1999
fDate :
1999
Firstpage :
343
Lastpage :
347
Abstract :
IBM Microelectronics Division has recently developed and shipped its first advanced wiring density chip carriers which provide 50 Ω impedance, via size down to 55 μm diameter and 34 μm line widths for high density I/O flip chip applications. The alumina chip carriers use thick film molybdenum features which can provide a wiring channel between 225 μm pitch chip I/O connections for voltage and signal wiring. In some applications, the number of signal wiring layers can be reduced by a factor of two. The high density voltage and ground layers provide a low inductance path which minimizes voltage drop across the carrier, thereby optimizing chip power distribution. This characteristic is particularly important for high frequency operation. In many high chip I/O applications, the increased wiring density permits the use of up to 4 die shrinks, which can reduce overall module costs significantly. The increased wiring density is compatible with CPGA, CCGA, CBGA and CLGA form factors. This paper summarizes the key electrical attributes of the package and compares results for two design variations with advanced wiring chip carrier fabrication. It is shown that both design variations result in a 50 Ω impedance package. Additionally, both designs result in improved power distribution with a reduction in signal switching noise. For a fully populated array design, 30% or more reduction in signal switching noise is obtained
Keywords :
ceramic packaging; circuit optimisation; electric impedance; flip-chip devices; hybrid integrated circuits; integrated circuit design; integrated circuit interconnections; integrated circuit noise; integrated circuit packaging; switching; 225 micron; 34 micron; 50 ohm; 55 micron; Al2O3; CBGA form factor; CCGA form factor; CLGA form factor; CPGA form factor; Mo-Al2O3; advanced wiring chip carrier fabrication; alumina chip carriers; ceramic chip carrier; chip I/O connection pitch; chip carriers; chip power distribution optimization; design variations; die shrinks; flip chip applications; fully populated array design; high density I/O flip chip applications; high density ground layer; high density voltage layer; high frequency operation; impedance; line width; low inductance path; module costs; package impedance; power distribution; signal switching noise; signal wiring; signal wiring layers; thick film molybdenum features; via size; voltage drop minimization; voltage wiring; wiring channel; wiring density; Ceramics; Flip chip; Impedance; Microelectronics; Noise reduction; Packaging; Power distribution; Signal design; Voltage; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1999. Twenty-Fourth IEEE/CPMT
Conference_Location :
Austin, TX
ISSN :
1089-8190
Print_ISBN :
0-7803-5502-4
Type :
conf
DOI :
10.1109/IEMT.1999.804843
Filename :
804843
Link To Document :
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