Title :
Support vector regression and particle swarm optimization algorithm for intelligent electronic circuit fault diagnosis
Author :
Tian, WenJie ; Tian, Yue ; Ai, Lan ; Liu, JiCheng
Author_Institution :
Autom. Inst., Beijing Union Univ., Beijing, China
Abstract :
In the analysis of electronic circuit fault diagnosis based on support vector regression (SVR), irrelevant or correlated features in the samples could spoil the performance of the SVR classifier, leading to decrease of prediction accuracy. In order to solve the problems mentioned above, this paper used rough sets as a preprocessor of SVR to select a subset of input variables and employed the particle swarm optimization algorithm (PSOA) to optimize the parameters of SVR. Additionally, the proposed PSOA-SVR model that can automatically determine the optimal parameters was tested on the prediction of electronic circuit fault. Then, we compared the proposed PSOA-SVR model with other artificial intelligence models of (BPN and fix-SVR). The experiment indicates that the proposed method is quite effective and ubiquitous.
Keywords :
diagnostic expert systems; electronic engineering computing; fault diagnosis; particle swarm optimisation; pattern classification; regression analysis; rough set theory; support vector machines; BPN; PSOA-SVR model; SVR classifier; artificial intelligence model; intelligent electronic circuit fault diagnosis; intelligent expert system; particle swarm optimization algorithm; rough set theory; subset selection; support vector regression; ubiquitous method; Accuracy; Circuit analysis; Circuit testing; Data preprocessing; Electronic circuits; Fault diagnosis; Input variables; Particle swarm optimization; Performance analysis; Rough sets; electronic circuit; fault diagnosis; particle swarm optimization algorithm; rough set; support vector regression;
Conference_Titel :
Computer Science and Information Technology, 2009. ICCSIT 2009. 2nd IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4519-6
Electronic_ISBN :
978-1-4244-4520-2
DOI :
10.1109/ICCSIT.2009.5234888