DocumentCode :
3318152
Title :
Quantitative assessment of the single-band model in the silicon based resonant tunneling devices
Author :
Sandu, Titus
Author_Institution :
Nat. Inst. for R&D in Microtechnol., Bucharest, Romania
Volume :
02
fYear :
2010
fDate :
11-13 Oct. 2010
Firstpage :
443
Lastpage :
446
Abstract :
We analyse the adequacy of the single-band model in Si based resonant tunneling devices (RTD´s) as opposed to a multi-band model which is closer to real systems due to the fact that Si is an indirect bandgap semiconductor. Our calculations based on non-equilibrium Green function formalism show that a single band model with tunneling light electrons in Si is quantitatively sound in simulating Si based RTD´s. It is found that light electrons contribute not only through 2-dimensional (2D) transverse density of states but also through the transparency of the barriers. Thus a single-band model can be safely used in applications.
Keywords :
Green´s function methods; elemental semiconductors; resonant tunnelling devices; silicon; Si; indirect bandgap semiconductor; multiband model; nonequilibrium Green function formalism; silicon based resonant tunneling devices; single-band model; Current density; Effective mass; Helium; Resonant tunneling devices; Scattering; Silicon; electron transport; non-equilibrium Green function; resonant tunneling devices; silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference (CAS), 2010 International
Conference_Location :
Sinaia
ISSN :
1545-827X
Print_ISBN :
978-1-4244-5783-0
Type :
conf
DOI :
10.1109/SMICND.2010.5650568
Filename :
5650568
Link To Document :
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