Title :
Swarm intelligence based optimization and control of decentralized serial sensor networks
Author :
Veeramachaneni, Kalyan ; Osadciw, Lisa
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Syracuse Univ., Syracuse, NY
Abstract :
In this paper threshold design and hierarchy management of serial sensor networks employed for distributed detection is accomplished using a hybrid of ant colony optimization and particle swarm optimization. The particle swarm optimization determines the optimal thresholds, decision rules for the sensors. The ant colony optimization algorithm determines the hierarchy of sensor decision communication, affecting the accuracy. The problem of hierarchy management is known as ldquowho reports to whom?rdquo problem in sensor networks. The new algorithm is tested on a suite of 10 heterogeneous sensors. Probabilistic measures including probability of error and Bayesian risk are adopted to evaluate the performance of the sensor network. The new sensor management methodology is compared to (a) static hierarchy network, (b) a network with the best sensor at the top of the hierarchy and (c) incrementally best hierarchy. Results show 40% performance improvements in terms of Bayesian risk value.
Keywords :
Bayes methods; decentralised control; distributed sensors; particle swarm optimisation; telecommunication control; Bayesian risk value; ant colony optimization; decentralized serial sensor network control; distributed detection; incrementally best hierarchy; particle swarm optimization; static hierarchy network; swarm intelligence based optimization; Ant colony optimization; Bayesian methods; Biosensors; Chemical and biological sensors; Fault detection; Intelligent sensors; Intrusion detection; Parallel architectures; Particle swarm optimization; Sensor phenomena and characterization; Distributed detection; ant colony optimization; particle swarm optimization; sensor networks;
Conference_Titel :
Swarm Intelligence Symposium, 2008. SIS 2008. IEEE
Conference_Location :
St. Louis, MO
Print_ISBN :
978-1-4244-2704-8
Electronic_ISBN :
978-1-4244-2705-5
DOI :
10.1109/SIS.2008.4668332