DocumentCode :
33187
Title :
An All-SiC High-Frequency Boost DC–DC Converter Operating at 320 °C Junction Temperature
Author :
Xueqian Zhong ; Xinke Wu ; Weicheng Zhou ; Kuang Sheng
Author_Institution :
Coll. of Electr. Eng., Zhejiang Univ., Hangzhou, China
Volume :
29
Issue :
10
fYear :
2014
fDate :
Oct. 2014
Firstpage :
5091
Lastpage :
5096
Abstract :
This letter presents the design, prototype development, operation, and testing of an 800 kHz, 1 kW, 800 V output boost dc-dc converter module that integrates SiC MOSFET and SiC Schottky diode die. It is observed that when the device loss is dominated by switching loss, the steady-state junction temperature of SiC MOSFET can reach as high as 320°C. This is the highest self-heated junction temperature operation of SiC power devices under room temperature ambient reported in the literature. The high-frequency switching characteristics and high-temperature thermal reliability of the assessed converter are evaluated in detail. A solder-molten phenomenon during high junction temperature operation is detected and the die-attachment material is thus improved to enhance the high-temperature thermal reliability of the converter module. This study shows that the high-frequency capability of a gate driver and high-temperature die-attachment technology can be limiting factors preventing SiC power devices from operating at higher junction temperatures.
Keywords :
DC-DC power convertors; MOSFET; Schottky diodes; power integrated circuits; reliability; silicon compounds; wide band gap semiconductors; MOSFET; Schottky diode die; SiC; device loss; die-attachment material; frequency 800 kHz; gate driver; high-frequency boost DC-DC converter; high-frequency capability; high-frequency switching characteristics; high-temperature die-attachment technology; high-temperature thermal reliability; power 1 kW; power devices; self-heated junction temperature; solder-molten phenomenon; steady-state junction temperature; switching loss; voltage 800 V; Junctions; MOSFET; Silicon carbide; Switches; Temperature; Temperature measurement; Thermal resistance; Boost converter; high frequency; high temperature; junction temperature; silicon carbide (SiC);
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2014.2311800
Filename :
6766689
Link To Document :
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