Title :
Diagnosis of open defects in FPGA interconnect
Author :
Tahoori, Mehdi Baradaran
Author_Institution :
Center for Reliable Comput., Stanford Univ., CA, USA
Abstract :
In this paper, we present coarse-grain and fine-grain diagnosis techniques to identify a faulty element in FPGA interconnects. The fault model we use is stuck-open and resistive-open for interconnects. The presented technique requires only a small number of configurations while offering high resolution diagnosis. We implemented this technique on real FPGA chips and verified it using fault emulation.
Keywords :
failure analysis; fault diagnosis; field programmable gate arrays; integrated circuit interconnections; integrated circuit testing; logic testing; FPGA faulty element; FPGA interconnects; coarse-grain fault diagnosis techniques; failure analysis; fine-grain diagnosis; high resolution diagnosis; open defects; programmable interconnect points; resistive-open faults; stuck-open faults; yield enhancement; Circuit faults; Failure analysis; Fault diagnosis; Fault tolerance; Field programmable gate arrays; Integrated circuit interconnections; Logic arrays; Programmable logic arrays; Random access memory; Switches;
Conference_Titel :
Field-Programmable Technology, 2002. (FPT). Proceedings. 2002 IEEE International Conference on
Print_ISBN :
0-7803-7574-2
DOI :
10.1109/FPT.2002.1188703
