DocumentCode :
3318904
Title :
Novel Vth Hopping Techniques for Aggressive Runtime Leakage Control
Author :
Xu, Hao ; Jone, Wen-Ben ; Vemuri, Ranga
Author_Institution :
Dept. of ECE, Univ. of Cincinnati, Cincinnati, OH, USA
fYear :
2010
fDate :
3-7 Jan. 2010
Firstpage :
51
Lastpage :
56
Abstract :
The continuous increase of leakage power consumption in deep sub-micro technologies necessitates more aggressive leakage control. Runtime leakage control (RTLC) is effective, since runtime circuits generally have significant amount of idleness. However, current RTLC techniques are only used when circuits have long idleness, rendering the techniques less profitable. The reason is due to the large energy and delay overhead when performing RTLC mode transition. We propose two novel techniques, workload-adaptive Vth hopping (WAVTH) and hierarchical Vth hopping (HIVTH), to tackle the overhead problems and enable aggressive runtime leakage control. Experimental results show 19.2% average improvement on leakage saving with WAVTH and HIVTH over basic Vth hopping. The optimum design points of these two techniques are determined through accurate modeling.
Keywords :
VLSI; integrated circuit design; integrated circuit modelling; RTLC mode transition; VLSI; aggressive leakage control; deep sub-micro technologies; hierarchical Vth hopping; leakage power consumption; optimum design points; runtime leakage control; workload-adaptive Vth hopping; Delay; Energy consumption; Gate leakage; MOSFET circuits; Power MOSFET; Power control; Recycling; Runtime; Temperature; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2010. VLSID '10. 23rd International Conference on
Conference_Location :
Bangalore
ISSN :
1063-9667
Print_ISBN :
978-1-4244-5541-6
Type :
conf
DOI :
10.1109/VLSI.Design.2010.86
Filename :
5401181
Link To Document :
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