• DocumentCode
    3318916
  • Title

    Fabrication and design of Diffractive Optical layer applied to Resonant Cavity LED

  • Author

    Chang, Sheng-Hsiung ; Liang, Tsair-Chun ; Yue, Cheng-Feng ; Huang, Sin-Yao

  • Author_Institution
    Dept. of Optoelectron. Eng., Far East Univ., Tainan, Taiwan
  • Volume
    2
  • fYear
    2010
  • fDate
    5-7 May 2010
  • Firstpage
    507
  • Lastpage
    510
  • Abstract
    To optical packaging cost and enhance alignment accuracy, a new application strategy of Diffractive Optical Element (DOE) had been proposed to develop a new technology that can integrate DOE and Resonant Cavity LED (RCLED) in semiconductor manufacture processing. The passivation layer SiO2 used to fabricate the integrated DOE of Dammann Grating. Applied scalar diffraction principle through using G-solver software, Binary Phase Fourier Grating (B.P.F.G.) was designed to control the spatial distribution of emitted light energy along LED surface through adjusting geometric shape and depth of grates. Confirming several B.P.F.G. designs by measuring outcome light distributions, such DOE had been successfully manufactured directly on LED wafers.
  • Keywords
    cavity resonators; diffraction gratings; diffractive optical elements; light emitting diodes; optical design techniques; optical fabrication; Dammann grating; G-solver software; alignment accuracy; binary phase Fourier grating; diffractive optical element; diffractive optical layer; optical packaging cost; resonant cavity LED; scalar diffraction principle; semiconductor manufacture processing; Costs; Integrated optics; Light emitting diodes; Optical design; Optical device fabrication; Optical diffraction; Resonance; Semiconductor device packaging; Shape control; US Department of Energy; DOE; DOE-RCLED; RCLED;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Communication Control and Automation (3CA), 2010 International Symposium on
  • Conference_Location
    Tainan
  • Print_ISBN
    978-1-4244-5565-2
  • Type

    conf

  • DOI
    10.1109/3CA.2010.5533394
  • Filename
    5533394