DocumentCode
331897
Title
A 500 Mb/s 10/32 channel, 0.5 μm CMOS VCSEL driver with built-in self-test and clock generation circuitry
Author
Kiamilev, Fouad E.
Author_Institution
North Carolina Univ., Charlotte, NC, USA
Volume
1
fYear
1998
fDate
1-4 Dec 1998
Firstpage
168
Abstract
We have designed and fabricated 10 and 32 channel CMOS VCSEL driver ICs with built-in self-test and clock generation circuitry. The circuit design and silicon parts are available to the research community through the Optoelectronics Industry Association (OIDA)
Keywords
CMOS integrated circuits; built-in self test; clocks; driver circuits; integrated optoelectronics; semiconductor lasers; surface emitting lasers; 0.5 mum; 500 Mbit/s; CMOS VCSEL driver ICs; Mb/s 10/32 channel 0.5 μm CMOS VCSEL driver; Optoelectronics Industry Association; built-in self-test circuitry; circuit design; clock generation circuitry; research community; silicon parts; Built-in self-test; Circuit synthesis; Circuit testing; Clocks; Current measurement; Driver circuits; Laser modes; Optical design; Silicon; Vertical cavity surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1998. LEOS '98. IEEE
Conference_Location
Orlando, FL
Print_ISBN
0-7803-4947-4
Type
conf
DOI
10.1109/LEOS.1998.737784
Filename
737784
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