• DocumentCode
    3318987
  • Title

    Notice of Retraction
    A Model of Mechanisms of Cellular Defending Genome Stress Based on KTAP Framework

  • Author

    Jinpeng Qi ; Yongsheng Ding ; Yizhi Wu ; Ying Zhu

  • Author_Institution
    Coll. of Inf. Sci. & Technol., Donghua Univ., Shanghai, China
  • fYear
    2011
  • fDate
    10-12 May 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Notice of Retraction

    After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

    We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

    The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

    Under acute perturbations from outer environment, a mathematical model of cellular self-defense mechanisms is proposed by using the method of Kinetic Theory of Active Particles (KTAP). In the processes of DNA damage repair, DNA damage and Repair Protein (RP) generating, DSBC synthesizing are implemented by the particle interactions between the pairs of DNA and acute Ion Radiation (IR), DNA damage and RP. Furthermore, cellular self-repair capability, cellular activity and genome stability are analyzed under different IR dose domains.
  • Keywords
    DNA; biological effects of ionising particles; cellular effects of radiation; genomics; kinetic theory; molecular biophysics; physiological models; proteins; DNA damage; DNA damage repair; KTAP framework; active particles; acute ion radiation; cellular activity; cellular defending genome stress; cellular self-defense mechanisms; cellular self-repair capability; genome stability; kinetic theory; repair protein; Bioinformatics; DNA; Genomics; Kinetic theory; Maintenance engineering; Mathematical model; Stability analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bioinformatics and Biomedical Engineering, (iCBBE) 2011 5th International Conference on
  • Conference_Location
    Wuhan
  • ISSN
    2151-7614
  • Print_ISBN
    978-1-4244-5088-6
  • Type

    conf

  • DOI
    10.1109/icbbe.2011.5780105
  • Filename
    5780105