DocumentCode :
3319116
Title :
A 10 Gb/s CMOS half-rate clock and data recovery circuit with direct bang-bang tuning
Author :
Chen, Tun-Shih
Author_Institution :
SoC Technol. Center, Ind. Technol. Res. Inst., Hsinchu, Taiwan
fYear :
2005
fDate :
30 Nov.-2 Dec. 2005
Firstpage :
57
Lastpage :
60
Abstract :
This paper describes the detail design considerations and verification of a 10 Gb/s half-rate clock and data recovery circuit (CDR). This CDR circuit utilizes half-rate bang-bang architecture with additional frequency acquisition loop to ensure proper operation and avoid false locking. Direct bang-bang frequency tuning is applied to eliminate the latency of the charge pump and allow flexible control of the small bang-bang frequency tuning step. The CDR circuit was fabricated in TSMC 0.13 μm RF/MS CMOS technology. Experimental results show 1.4 ps rms jitter and 7 ps peak-to-peak jitter generation by 231-1 PRBS at a rate of 10 Gb/s. Jitter transfer bandwidth is about 8 MHz and jitter tolerance has large margin above OC-192 mask. The circuit excluding the output buffers dissipates 86 mW power at 1.5 V power supply. The die size including the pads is 1.3×1.5 mm2.
Keywords :
CMOS integrated circuits; circuit tuning; integrated circuit design; jitter; synchronisation; 0.13 mum; 1.5 V; 10 Gbit/s; 86 mW; CMOS half-rate clock; RF/MS CMOS technology; charge pump; data recovery circuit; direct bang-bang tuning; frequency acquisition loop; jitter generation; jitter tolerance; transfer bandwidth; Bandwidth; CMOS technology; Charge pumps; Circuit optimization; Clocks; Delay; Frequency locked loops; Jitter; Radio frequency; Tuning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio-Frequency Integration Technology: Integrated Circuits for Wideband Communication and Wireless Sensor Networks, 2005. Proceedings. 2005 IEEE International Workshop on
Print_ISBN :
0-7803-9372-4
Type :
conf
DOI :
10.1109/RFIT.2005.1598873
Filename :
1598873
Link To Document :
بازگشت