Title :
Advanced semiconductor laser based electro-optical sampling system using soliton pulse compression for direct probing at 1.55-μm wavelength
Author :
Reimann, O. ; Huhse, D. ; Dröge, E. ; Botcher, E.H. ; Bimberg, D. ; Stahlmann, H.-D.
Author_Institution :
Inst. of Solid State Phys., Tech. Univ. Berlin, Germany
Abstract :
We report on a compact, reliable and easy to use electro-optic sampling (EOS) system with high temporal resolution, and increased voltage sensitivity. With an operating wavelength of 1.55 μm and subpicosecond time jitter of the optical source, it is particularly suited for characterizing ultrafast long-wavelength photodetectors and receivers as well as electrically synchronized ultrahigh-speed devices and ICs
Keywords :
laser reliability; measurement by laser beam; optical pulse compression; optical receivers; optical solitons; optical testing; photodetectors; semiconductor lasers; sensitivity; timing jitter; 1.55 mum; 1.55-μm wavelength; ICs; advanced semiconductor laser based electro-optical sampling system; direct probing; electrically synchronized ultrahigh-speed devices; high temporal resolution; increased voltage sensitivity; operating wavelength; optical receivers; optical source; soliton pulse compression; subpicosecond time jitter; ultrafast long-wavelength photodetectors; Earth Observing System; Jitter; Lasers and electrooptics; Optical devices; Optical receivers; Optical sensors; Sampling methods; Semiconductor lasers; Ultrafast optics; Voltage;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1998. LEOS '98. IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-4947-4
DOI :
10.1109/LEOS.1998.737806
