An approach to generating test data sequences of boundary scan test system

The research on boundary scan test has Become an important issue because of IEEE 1149.1 standard providing an effective approach to test devices, circuit boards or system with physical limited access. In this paper, the definition of a testing data sequence is proposed, and the aspects which influences on the generating of testing data sequences, such as the boundary scan chain structure, the test configuration script, interconnection net-list, BSCR´s structure and support fault types are excavated out. Based on the analyses of BSDL files of JTAG device, the circuits or system net-list files, the approach of generating test data sequences are proposed. The proposed approach supports integrality testing, interconnect testing, device function testing, sample testing, personality testing and so on. A prototype testing platform based on boundary scan test is constructed in order to validate the affectivity of the proposed approach. The experiments show that the proposed approach is effective.