DocumentCode
3319225
Title
Power-Aware Test Framework for Network-on-Chip
Author
Ahn, Byung-Gyu ; Jung, Jun-Mo ; Chong, Jong-Wha
Author_Institution
Dept. of ECE, Hanyang Univ., Seoul
fYear
2008
fDate
13-18 April 2008
Firstpage
103
Lastpage
107
Abstract
In this paper, we propose the power-aware test framework for network-on-chip (NoC). First, the possibility of using embedded processor and on-chip network are introduced and evaluated with benchmark system to test the other embedded cores. Second, a new generation method of test pattern, which is called ´don´t care mapping´, is presented to reduce the power consumption of on-chip network. The experimental results show that the power consumption is reduced up to 8% at the communication components.
Keywords
network-on-chip; benchmark system; communication components; embedded processor; network-on-chip; power consumption reduction; power-aware test framework; Bandwidth; Benchmark testing; Cost function; Design for testability; Energy consumption; Network-on-a-chip; Power generation; System testing; System-on-a-chip; Test pattern generators; NoC; low-power; test;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, 2008. ICONS 08. Third International Conference on
Conference_Location
Cancun
Print_ISBN
978-0-7695-3105-2
Electronic_ISBN
978-0-7695-3105-2
Type
conf
DOI
10.1109/ICONS.2008.49
Filename
4497105
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