• DocumentCode
    3319225
  • Title

    Power-Aware Test Framework for Network-on-Chip

  • Author

    Ahn, Byung-Gyu ; Jung, Jun-Mo ; Chong, Jong-Wha

  • Author_Institution
    Dept. of ECE, Hanyang Univ., Seoul
  • fYear
    2008
  • fDate
    13-18 April 2008
  • Firstpage
    103
  • Lastpage
    107
  • Abstract
    In this paper, we propose the power-aware test framework for network-on-chip (NoC). First, the possibility of using embedded processor and on-chip network are introduced and evaluated with benchmark system to test the other embedded cores. Second, a new generation method of test pattern, which is called ´don´t care mapping´, is presented to reduce the power consumption of on-chip network. The experimental results show that the power consumption is reduced up to 8% at the communication components.
  • Keywords
    network-on-chip; benchmark system; communication components; embedded processor; network-on-chip; power consumption reduction; power-aware test framework; Bandwidth; Benchmark testing; Cost function; Design for testability; Energy consumption; Network-on-a-chip; Power generation; System testing; System-on-a-chip; Test pattern generators; NoC; low-power; test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, 2008. ICONS 08. Third International Conference on
  • Conference_Location
    Cancun
  • Print_ISBN
    978-0-7695-3105-2
  • Electronic_ISBN
    978-0-7695-3105-2
  • Type

    conf

  • DOI
    10.1109/ICONS.2008.49
  • Filename
    4497105