• DocumentCode
    3319351
  • Title

    Modeling and simulations of 1 KV/5 A normally-off 4H-SiC VJFET

  • Author

    Khalid, M. ; Riaz, S. ; Naseem, S.

  • Author_Institution
    Centre of Excellence in Solid State Phys., Univ. of the Punjab, Lahore, Pakistan
  • fYear
    2011
  • fDate
    22-24 Dec. 2011
  • Firstpage
    233
  • Lastpage
    237
  • Abstract
    Silicon carbide (SiC) has proved to be a promising material for the development of high temperature and high power applications because of excellent thermal and physical properties. In this study, 2D numerical simulation is performed using industry based Sentaurus TCAD tools. The aim of this research work is to design a device which provides high performance for power applications. Complete design provides the excellent forward and blocking characteristics. Simulation results show that increasing temperature, improve the forward characteristics and 5 A saturation current at 600 K is observed at VGS = 3 V. Also, a very low on-resistance is observed at 600 K which is 0.027 mΩ. The design also provides good blocking capability at room temperature which indicates high value of figure of merits (FOM). The calculated values of FOM decrease with increasing temperature and 19.75 MW (300 K) to 0.5 MW (600 K) are observed at VGS = -2 V. In addition, its high current value and superior FOM makes 4H-SiC VJFET an excellent device that can give better performance for high temperature and high power applications.
  • Keywords
    junction gate field effect transistors; power semiconductor devices; semiconductor device models; silicon compounds; wide band gap semiconductors; 2D numerical simulation; Sentaurus TCAD tool; SiC; blocking capability; current 5 A; high power application; high temperature application; normally off VJFET; resistance 0.027 mohm; voltage 1 kV; Logic gates; Numerical models; FOM; On-resistance; blocking voltage; normally-off;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multitopic Conference (INMIC), 2011 IEEE 14th International
  • Conference_Location
    Karachi
  • Print_ISBN
    978-1-4577-0654-7
  • Type

    conf

  • DOI
    10.1109/INMIC.2011.6151479
  • Filename
    6151479