• DocumentCode
    3319802
  • Title

    Enhanced high-speed photoresponse by diffusion of iron into undoped semi-insulating GaAs

  • Author

    Ohsawa, Jun ; Ozaki, Yasutaka

  • Author_Institution
    Toyota Technol. Inst., Nagoya, Japan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    159
  • Lastpage
    162
  • Abstract
    Responses to picosecond light pulses have been compared on undoped liquid encapsulated Czochralski (LEC) semi-insulating wafers with and without iron doping. A large photocurrent, especially at the leading edge, for the iron-doped sample is expected because of increased hole capturing by the deep acceptors of iron, as well as decreased electron capturing caused by a concomitant decrease of deep donors such as EL2 and EL6. This was confirmed by the photocurrent decay at higher excitation, which is dominated by electrons in iron doped case, in contrast to holes in the undoped case
  • Keywords
    III-V semiconductors; diffusion; gallium arsenide; high-speed optical techniques; hole traps; impurity states; iron; photoconductivity; EL2; EL6; Fe diffusion; GaAs; GaAs:Fe; concomitant deep donors; decreased electron capture; deep acceptors; enhanced high-speed photoresponse; hole capture; photocurrent; photocurrent decay; picosecond light pulses; undoped liquid encapsulated Czochralski semi-insulating wafers; undoped semi-insulating GaAs; Charge carrier lifetime; Charge carrier processes; Conductivity; Doping; Electrodes; Gallium arsenide; Iron; Photoconductivity; Pulse measurements; Spontaneous emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconducting and Insulating Materials Conference, 2000. SIMC-XI. International
  • Conference_Location
    Canberra, ACT
  • Print_ISBN
    0-7803-5814-7
  • Type

    conf

  • DOI
    10.1109/SIM.2000.939218
  • Filename
    939218