DocumentCode
3319802
Title
Enhanced high-speed photoresponse by diffusion of iron into undoped semi-insulating GaAs
Author
Ohsawa, Jun ; Ozaki, Yasutaka
Author_Institution
Toyota Technol. Inst., Nagoya, Japan
fYear
2000
fDate
2000
Firstpage
159
Lastpage
162
Abstract
Responses to picosecond light pulses have been compared on undoped liquid encapsulated Czochralski (LEC) semi-insulating wafers with and without iron doping. A large photocurrent, especially at the leading edge, for the iron-doped sample is expected because of increased hole capturing by the deep acceptors of iron, as well as decreased electron capturing caused by a concomitant decrease of deep donors such as EL2 and EL6. This was confirmed by the photocurrent decay at higher excitation, which is dominated by electrons in iron doped case, in contrast to holes in the undoped case
Keywords
III-V semiconductors; diffusion; gallium arsenide; high-speed optical techniques; hole traps; impurity states; iron; photoconductivity; EL2; EL6; Fe diffusion; GaAs; GaAs:Fe; concomitant deep donors; decreased electron capture; deep acceptors; enhanced high-speed photoresponse; hole capture; photocurrent; photocurrent decay; picosecond light pulses; undoped liquid encapsulated Czochralski semi-insulating wafers; undoped semi-insulating GaAs; Charge carrier lifetime; Charge carrier processes; Conductivity; Doping; Electrodes; Gallium arsenide; Iron; Photoconductivity; Pulse measurements; Spontaneous emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconducting and Insulating Materials Conference, 2000. SIMC-XI. International
Conference_Location
Canberra, ACT
Print_ISBN
0-7803-5814-7
Type
conf
DOI
10.1109/SIM.2000.939218
Filename
939218
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