Title :
A Reliability Enhancing Mechanism for a Large Flash Embedded Satellite Storage System
Author_Institution :
PRiSM Lab., Univ. of Versailles, Versailles
Abstract :
In this paper, we propose an embedded satellite storage architecture based on the MLC NAND flash memory chips. We focus on data reliability and enhance it by adapting the RAID5 mechanism to the flash technology. This adaptation takes into account both the application and the technology characteristics : the specific access profile determines the striping granularity and the specific flash technology determines the data placement/management policy. It results an efficient mechanism, simple to implement at the FTL (flash translation layer) level without any use of the garbage collection. Thus, improving reliability using this mechanism leads to improving performance in the particular on-board satellite storage context.
Keywords :
RAID; embedded systems; flash memories; integrated circuit reliability; storage management chips; MLC NAND flash memory chips; RAID5; data management; data placement; data reliability; embedded satellite storage architecture; flash translation layer; large flash embedded satellite storage system; Earth; Energy consumption; Energy storage; Flash memory; Laboratories; Nonvolatile memory; Satellites; Signal processing algorithms; Technology management; Throughput; Flash memory; RAID; performance; reliability; satellite; storage system;
Conference_Titel :
Systems, 2008. ICONS 08. Third International Conference on
Conference_Location :
Cancun
Print_ISBN :
978-0-7695-3105-2
Electronic_ISBN :
978-0-7695-3105-2
DOI :
10.1109/ICONS.2008.74
