LF noise and reliability of Gunn diodes

On the basis of these investigations it possible to state the following: there is a strong relation between LF noise level and diode technology quality; the relation between LF noise and reliability can be considered mainly as a statistical problem, but for worse technologies the quantity of the test sample may be relatively small; the noise measurement with the aim of reliability estimation is not recommended in the case of commercial semiconductor devices made with the use of high quality technologies, but it is recommended in the case of special and military applications (it is also recommended for new technology preparation); and not only noise level but also noise level changes during initial time of work can be considered as the reliability indicator