DocumentCode
332012
Title
New designs of the measurement heads for testing Gunn diodes in the 26-40 GHz range
Author
Parafianowicz, Jan
Author_Institution
Inst. of Electron. Technol., Warsaw, Poland
fYear
1998
fDate
20-22 May 1998
Firstpage
84
Abstract
The aim of this paper was to present two new designs of measurement oscillators for measurements of the generated power and frequency (in the 26-40 GHz range) of Gunn diodes, as well as time dependencies in the case of pulse supply applied to the devices under test. Moreover, measurement heads were built for measurements of Gunn diode chips. The possibility to build generators with nonremovable Gunn diode chips was investigated
Keywords
Gunn diodes; microwave measurement; semiconductor device measurement; semiconductor device testing; 26 to 40 GHz; Gunn diodes; devices under test; measurement heads; measurement oscillators; nonremovable diode chips; pulse supply; time dependencies; Diodes; Frequency measurement; Gunn devices; Oscillators; Power generation; Power measurement; Pulse measurements; Semiconductor device measurement; Testing; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwaves and Radar, 1998. MIKON '98., 12th International Conference on
Conference_Location
Krakow
Print_ISBN
83-906662-0-0
Type
conf
DOI
10.1109/MIKON.1998.737924
Filename
737924
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