DocumentCode
3320192
Title
Epileptic EEG Detection via a Novel Pattern Recognition Framework
Author
Song, Yuedong ; Liò, Pietro
Author_Institution
Comput. Lab., Univ. of Cambridge, Cambridge, UK
fYear
2011
fDate
10-12 May 2011
Firstpage
1
Lastpage
6
Abstract
In this paper, we investigate the potential of a recently-developed machine learning algorithm named Extreme Learning Machine (ELM), together with Sample Entropy (SampEn), to the task of identifying epileptic EEG signals. In order to decrease network complexity of ELM and reduce the subjectivity involved in selecting the number of hidden neurons in ELM network, we propose a structure-optimized strategy for enhancing the ELM algorithm. Experimental results show that the proposed algorithm not only achieves more compact network structure and higher accuracy, but also needs less learning time than conventional ELM and gradient-based algorithms such as Backpropagation Neural Network (BPNN).
Keywords
electroencephalography; entropy; learning (artificial intelligence); medical signal detection; neural nets; pattern recognition; backpropagation neural network; epileptic EEG detection; extreme learning machine; gradient-based algorithm; machine learning; network complexity; network structure; pattern recognition; sample entropy; Accuracy; Brain models; Electroencephalography; Entropy; Machine learning; Neurons;
fLanguage
English
Publisher
ieee
Conference_Titel
Bioinformatics and Biomedical Engineering, (iCBBE) 2011 5th International Conference on
Conference_Location
Wuhan
ISSN
2151-7614
Print_ISBN
978-1-4244-5088-6
Type
conf
DOI
10.1109/icbbe.2011.5780179
Filename
5780179
Link To Document