DocumentCode
3320196
Title
Experimental Investigation of the Fault Tolerance of IDS Models
Author
Murakami, Masayuki ; Honda, Nakaji
Author_Institution
Univ. of Electro-Commun., Tokyo
fYear
2007
fDate
23-26 July 2007
Firstpage
1
Lastpage
7
Abstract
The ink drop spread (IDS) method is a modeling technique that is proposed as a new paradigm of soft computing. The structure of IDS models is similar to that of artificial neural networks (ANNs): they comprise distributed processing units. The beneficial property of fault tolerance is obtained when such parallel processing networks are implemented with dedicated hardware. Among the ANNs, radial basis function networks (RBFNs) are known to possess superior fault tolerance. This study evaluates the fault tolerances of the IDS models and RBFNs using the approximation of continuous functions. The experimental results demonstrate that the IDS models are highly fault tolerant in comparison with the RBFNs.
Keywords
fault tolerance; radial basis function networks; IDS models; RBFN; artificial neural networks; distributed processing units; fault tolerance; ink drop spread method; Artificial neural networks; Degradation; Distributed processing; Fault tolerance; Fault tolerant systems; Hardware; Ink; Intrusion detection; Parallel processing; Redundancy;
fLanguage
English
Publisher
ieee
Conference_Titel
Fuzzy Systems Conference, 2007. FUZZ-IEEE 2007. IEEE International
Conference_Location
London
ISSN
1098-7584
Print_ISBN
1-4244-1209-9
Electronic_ISBN
1098-7584
Type
conf
DOI
10.1109/FUZZY.2007.4295667
Filename
4295667
Link To Document