• DocumentCode
    3320196
  • Title

    Experimental Investigation of the Fault Tolerance of IDS Models

  • Author

    Murakami, Masayuki ; Honda, Nakaji

  • Author_Institution
    Univ. of Electro-Commun., Tokyo
  • fYear
    2007
  • fDate
    23-26 July 2007
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    The ink drop spread (IDS) method is a modeling technique that is proposed as a new paradigm of soft computing. The structure of IDS models is similar to that of artificial neural networks (ANNs): they comprise distributed processing units. The beneficial property of fault tolerance is obtained when such parallel processing networks are implemented with dedicated hardware. Among the ANNs, radial basis function networks (RBFNs) are known to possess superior fault tolerance. This study evaluates the fault tolerances of the IDS models and RBFNs using the approximation of continuous functions. The experimental results demonstrate that the IDS models are highly fault tolerant in comparison with the RBFNs.
  • Keywords
    fault tolerance; radial basis function networks; IDS models; RBFN; artificial neural networks; distributed processing units; fault tolerance; ink drop spread method; Artificial neural networks; Degradation; Distributed processing; Fault tolerance; Fault tolerant systems; Hardware; Ink; Intrusion detection; Parallel processing; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fuzzy Systems Conference, 2007. FUZZ-IEEE 2007. IEEE International
  • Conference_Location
    London
  • ISSN
    1098-7584
  • Print_ISBN
    1-4244-1209-9
  • Electronic_ISBN
    1098-7584
  • Type

    conf

  • DOI
    10.1109/FUZZY.2007.4295667
  • Filename
    4295667