DocumentCode :
3320201
Title :
Influence of Sb addition on microstructural evolution of Sn-Ag solder
Author :
Lee, Hwa-Teng ; Chen, Ming-Hung ; Hu, Shuen-Yuan ; Li, Cheng-Shyan
Author_Institution :
Mech. Eng. Dept., Nat. Cheng Kung Univ., Tainan, Taiwan
fYear :
2002
fDate :
4-6 Dec. 2002
Firstpage :
139
Lastpage :
144
Abstract :
This paper investigates the influence of various levels of Sb addition on the microstructure of Sn-Ag hypoeutectic solder. To be precise, the microstructural evolution and the characteristics of Sn2.58Ag solder are studied for Sb additions of 1.75, 4.75 and 8.78wt%. The experimental results indicate that part of the Sb addition solutes into the β-Sn matrix, while the remainder reacts with the Ag and Sn atoms to form ε-Ag3(Sb,Sn) and SbSn compounds. It is noted that Ag3(Sb,Sn) is readily formed even when the level of Sb addition is low (1.75%). This suggests that the Sb atoms are quite active in substituting some of the Sn atoms in the Ag3Sn compound to form a nonstoichiometry compound, i.e. Ag3(Sb,Sn). In contrast, the SbSn phase is only identified when the Sb content exceeds 4.75%. After a process of deep etching, it is observed that the morphology of the Ag3(Sb,Sn) phase in the as-soldered condition possesses a long-strip-like appearance. However, it is shown that if the cooling rate is sufficiently slow, then the β-Sn matrix and the Ag3(Sb,Sn) compound tend to solidify simultaneously in the as-cast condition. A coarse laminated structure is observed and the Ag3(Sb,Sn) phase appears platelike. This results in a substantial reduction in the strength and ductility of the solder joint. Finally, it is shown that the size of the SbSn phase remains at a constant value of ca.30 μm for the two cooling rate conditions considered in the present investigation.
Keywords :
X-ray diffraction; antimony; cooling; crystal microstructure; ductility; eutectic alloys; mechanical strength; packaging; silver alloys; soldering; tin alloys; β-Sn matrix; Ag3(Sb,Sn) phase morphology; Ag3(SbSn); Sb addition; SbSn; SbSn phase; Sn-Ag; Sn-Ag hypoeutectic solder; Sn2.58Ag solder; as-cast condition; coarse laminated structure; cooling rate; deep etching; microstructure; nonstoichiometry compound; plate-like structure; solder joint ductility reduction; solder joint strength reduction; solidification; Cooling; Etching; Matrices; Mechanical engineering; Mechanical factors; Microstructure; Morphology; Soldering; Thermal resistance; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2002. Proceedings of the 4th International Symposium on
Print_ISBN :
0-7803-7682-X
Type :
conf
DOI :
10.1109/EMAP.2002.1188827
Filename :
1188827
Link To Document :
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