• DocumentCode
    3320288
  • Title

    Sentry Selection in Sensor Networks: A Sufficient Condition for k Single Covers

  • Author

    Balister, Paul ; Bollobás, Béla ; Haenggi, Martin ; Sarkar, Amites ; Walters, Mark

  • Author_Institution
    Dept. of Math., Univ. of Memphis, Memphis, TN
  • fYear
    2008
  • fDate
    12-14 March 2008
  • Firstpage
    106
  • Lastpage
    107
  • Abstract
    Wireless sensor networks are becoming increasingly popular due to their numerous applications and advances in microelectronics. One basic application is the surveillance or monitoring of large areas. Assuming n sensor nodes are randomly deployed and each sensor can cover a circular area of a certain radius r, a central question is what fraction the total area of interest can be expected to be covered (as a function of n and r). This question has been answered for certain cases. We present a recent result on a related problem, the so-called sentry selection problem. In practical applications, it is desirable to turn most of the sensor nodes off to conserve energy, while having a subset of nodes active acting as sentries. After a certain period of time, the sentry duty is moved to a disjoint set of nodes, and so on. Let the desired number of subsets be k. Then the sentry selection problem is the following: Find the minimum radius r such that there exists a partition of the node set into k subsets that each provide a (single) cover of the area of interest. Note that this is different from asking for k-coverage, since a k-cover may not be divisible into k single covers.
  • Keywords
    monitoring; set theory; surveillance; wireless sensor networks; disjoint node set; k-single coverage problem; large area surveillance/monitoring; sentry selection problem; wireless sensor networks; Chromium; Intelligent networks; Mathematics; Microelectronics; Protocols; Seminars; Statistics; Sufficient conditions; Tin; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, 2008 IEEE International Zurich Seminar on
  • Conference_Location
    Zurich
  • Print_ISBN
    978-1-4244-1681-3
  • Electronic_ISBN
    978-1-4244-1682-0
  • Type

    conf

  • DOI
    10.1109/IZS.2008.4497264
  • Filename
    4497264