• DocumentCode
    332035
  • Title

    Low-field electron transport mechanism in GaAs Gunn diodes and GaAs/GaAsins layers (MBE)

  • Author

    Wolkenberg, Andrej ; Przeslawski, Tomasz ; Klamka, Jerzy

  • Author_Institution
    Inst. of Electron Technol., Warsaw, Poland
  • fYear
    1998
  • fDate
    20-22 May 1998
  • Firstpage
    266
  • Abstract
    We present the basis of resistance calculations of Gunn diodes in a magnetic field and its dependence on field direction angle to the diode plane. Also the influence on the experimental results of diode electrode shape is considered. The current transport between electrodes and diode subsurface layers is shown to be tunnelling. For comparison the transport properties of thin GaAs/GaAsins layers are presented. The transport in the thin Gunn diodes layers is significantly better. We consider that the cause of such behaviour is the lower compensation ratio in the VPE layers of Gunn diodes material in contrast to MBE epitaxial layers
  • Keywords
    Gunn diodes; Hall mobility; III-V semiconductors; electron mobility; gallium arsenide; magnetoresistance; microwave diodes; semiconductor epitaxial layers; GaAs; GaAs Gunn diodes; VPE layers; compensation ratio; current transport; diode electrode shape; field direction angle; low-field electron transport mechanism; magnetic field; resistance calculations; Diodes; Electrodes; Electrons; Epitaxial layers; Gallium arsenide; Gunn devices; Magnetic fields; Molecular beam epitaxial growth; Shape; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwaves and Radar, 1998. MIKON '98., 12th International Conference on
  • Conference_Location
    Krakow
  • Print_ISBN
    83-906662-0-0
  • Type

    conf

  • DOI
    10.1109/MIKON.1998.737960
  • Filename
    737960