DocumentCode :
3320510
Title :
GEMINI: A triple-GEM detector read-out mixed-signal ASIC in 180nm CMOS
Author :
Pezzotta, A. ; Corradi, G. ; Croci, G. ; De Matteis, M. ; Murtas, F. ; Gorini, G. ; Baschirotto, A.
Author_Institution :
Dept. of Phys., Univ. of Milano-Bicocca, Milan, Italy
fYear :
2015
fDate :
24-27 May 2015
Firstpage :
1718
Lastpage :
1721
Abstract :
This paper presents GEMINI, an entire read-out System-on-Chip (SoC) to be used with the Triple Gas-Electron Multiplier (GEM) detector. Designed in CMOS 180 nm technology, GEMINI pushes towards the state-of-the-art for this peculiar detector front-end, as regards the count rate and detector pixel parasitic capacitance sustainability. It is composed of 16 channels, each performing a charge-to-voltage conversion via a Charge-Sensitive Preamplifier (CSP), a successive event discrimination with channel-independent threshold and an event-triggered reset. The CSP analog output and the LVDS discriminator output are available as chip outputs for each channel. The Q-to-V conversion accuracy is guaranteed by an automatic on-chip calibration unit, compensating for environmental, CMOS process and supply voltage variations. GEMINI is able to sustain a 5 Mcps count rate, managing up to 40 pF pixel capacitance and with a 2.7mW/ch power consumption.
Keywords :
CMOS integrated circuits; electron multiplier detectors; mixed analogue-digital integrated circuits; preamplifiers; readout electronics; system-on-chip; CMOS 180 nm technology; CMOS process; CSP; GEMINI; LVDS discriminator output; Q-to-V conversion accuracy; SoC; channel-independent threshold; charge-sensitive preamplifier; charge-to-voltage conversion; count rate; detector front-end; detector pixel parasitic capacitance sustainability; event-triggered reset; on-chip calibration unit; read-out system-on-chip; size 180 nm; successive event discrimination; supply voltage variations; triple GEM detector; triple gas-electron multiplier detector; triple-GEM detector read-out mixed-signal ASIC; CMOS integrated circuits; Calibration; Capacitance; Detectors; Noise; Sensitivity; System-on-chip; ASIC; CMOS; GEM; detector; front-end; low-power; preamplifier; read-out; system-on-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
Type :
conf
DOI :
10.1109/ISCAS.2015.7168984
Filename :
7168984
Link To Document :
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