DocumentCode :
3320534
Title :
Time-frequency signal and image processing of non-stationary signals with application to the classification of newborn EEG abnormalities
Author :
Boashash, Boualem ; Boubchir, Larbi ; Azemi, Ghasem
Author_Institution :
Electr. Eng. Dept., Qatar Univ. Coll. of Eng., Doha, Qatar
fYear :
2011
fDate :
14-17 Dec. 2011
Firstpage :
120
Lastpage :
129
Abstract :
This paper presents an introduction to time-frequency (T-F) methods in signal processing, and a novel approach for EEG abnormalities detection and classification based on a combination of signal related features and image related features. These features which characterize the non- stationary nature and the multi-component characteristic of EEG signals, are extracted from the T-F representation of the signals. The signal related features are derived from the T-F representation of EEG signals and include the instantaneous frequency, singular value decomposition, and energy based features. The image related features are extracted from the T-F representation considered as an image, using T-F image processing techniques. These combined signal and image features allow to extract more information from a signal. The results obtained on newborn and adult EEG data, show that the image related features improve the performance of the EEG seizure detection in classification systems based on multi-SVM classifier.
Keywords :
electroencephalography; medical image processing; medical signal detection; medical signal processing; support vector machines; time-frequency analysis; T-F representation; energy based features; image processing; multiSVM classifier; newborn EEG signal abnormality detection; nonstationary signals; singular value decomposition; time-frequency signal processing; Indexes; Matched filters; EEG Classification; EEG Time-Frequency Analysis; Instantaneous Frequency; Newborn EEG; Seizure; Time-Frequency Features; Time-Frequency Image Processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Processing and Information Technology (ISSPIT), 2011 IEEE International Symposium on
Conference_Location :
Bilbao
Print_ISBN :
978-1-4673-0752-9
Electronic_ISBN :
978-1-4673-0751-2
Type :
conf
DOI :
10.1109/ISSPIT.2011.6151545
Filename :
6151545
Link To Document :
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