• DocumentCode
    3320543
  • Title

    Kinematics parameters estimation for an AFM/robot integrated micro-force measurement system

  • Author

    Dong, Wei ; Rostoucher, David ; Gauthier, Michael

  • Author_Institution
    AS2M Dept., UFC, Besançon, France
  • fYear
    2010
  • fDate
    18-22 Oct. 2010
  • Firstpage
    6143
  • Lastpage
    6148
  • Abstract
    This paper introduces a novel atomic force microscope (AFM) and parallel robot integrated micro-force measurement system whose objective is the measurement of adhesion force between planar micro-objects. This paper is mainly focused on the kinematics parameters estimation between the objects to be measured, the parallel robot and the AFM system in order to position both objects during measurement. A substrate is placed on the end-platform of the parallel robot system, on which three markers are utilized as the reference information to the kinematics parameters estimation. The markers are identified by the AFM scanning in order to identify the kinematics parameters of the whole system. Based on the classic Gauss-Newton algorithm, the position and orientation can be solved. Finally, the effectiveness of the proposed method is demonstrated through the experiments on the prototype of the micro-force measurement system. The parameters estimation methodology outlined is generic and also can be extended to a variety of applications in calibration of micro-robots.
  • Keywords
    atomic force microscopy; force measurement; microrobots; parameter estimation; robot kinematics; AFM; Gauss-Newton algorithm; atomic force microscope; microforce measurement; microrobots; parallel robot; parameter estimation; robot kinematics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Robots and Systems (IROS), 2010 IEEE/RSJ International Conference on
  • Conference_Location
    Taipei
  • ISSN
    2153-0858
  • Print_ISBN
    978-1-4244-6674-0
  • Type

    conf

  • DOI
    10.1109/IROS.2010.5650724
  • Filename
    5650724