• DocumentCode
    3320624
  • Title

    Building up a Performance Measurement System to determine productivity metrics of semiconductor design projects

  • Author

    Hinrichs, N. ; Leppelt, P. ; Barke, E.

  • Author_Institution
    Inst. of Microelectron. Syst., Leibniz Univ., Hanover, Germany
  • fYear
    2007
  • fDate
    July 29 2007-Aug. 1 2007
  • Firstpage
    327
  • Lastpage
    329
  • Abstract
    Performance measurement is emerging as a significant utility in order to maintain and improve competitive advantages. With an all-embracing system, the management gets a multidimensional view to most relevant factors of the business process. In this paper, we discuss an approach of building up a framework for measuring the performance of semiconductor design projects. For this purpose, three established approaches, the Balanced Scorecard, the European Foundation for Quality Management Excellence Model and the Retail Performance Management System are presented and discussed in relation to our approach. Furthermore, proposals for future research are given.
  • Keywords
    design engineering; performance index; production; quality management; semiconductor industry; balanced scorecard; performance measurement system; productivity metrics; quality management excellence model; retail performance management system; semiconductor design projects; Control systems; Financial management; Multidimensional systems; Process design; Productivity; Proposals; Quality management; Semiconductor device measurement; Technological innovation; Total quality management; Performance Indicators; Performance Measurement; Productivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering Management Conference, 2007 IEEE International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-2145-9
  • Electronic_ISBN
    978-1-4244-2146-6
  • Type

    conf

  • DOI
    10.1109/IEMC.2007.5235054
  • Filename
    5235054