DocumentCode
3320624
Title
Building up a Performance Measurement System to determine productivity metrics of semiconductor design projects
Author
Hinrichs, N. ; Leppelt, P. ; Barke, E.
Author_Institution
Inst. of Microelectron. Syst., Leibniz Univ., Hanover, Germany
fYear
2007
fDate
July 29 2007-Aug. 1 2007
Firstpage
327
Lastpage
329
Abstract
Performance measurement is emerging as a significant utility in order to maintain and improve competitive advantages. With an all-embracing system, the management gets a multidimensional view to most relevant factors of the business process. In this paper, we discuss an approach of building up a framework for measuring the performance of semiconductor design projects. For this purpose, three established approaches, the Balanced Scorecard, the European Foundation for Quality Management Excellence Model and the Retail Performance Management System are presented and discussed in relation to our approach. Furthermore, proposals for future research are given.
Keywords
design engineering; performance index; production; quality management; semiconductor industry; balanced scorecard; performance measurement system; productivity metrics; quality management excellence model; retail performance management system; semiconductor design projects; Control systems; Financial management; Multidimensional systems; Process design; Productivity; Proposals; Quality management; Semiconductor device measurement; Technological innovation; Total quality management; Performance Indicators; Performance Measurement; Productivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering Management Conference, 2007 IEEE International
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-2145-9
Electronic_ISBN
978-1-4244-2146-6
Type
conf
DOI
10.1109/IEMC.2007.5235054
Filename
5235054
Link To Document