DocumentCode :
3320624
Title :
Building up a Performance Measurement System to determine productivity metrics of semiconductor design projects
Author :
Hinrichs, N. ; Leppelt, P. ; Barke, E.
Author_Institution :
Inst. of Microelectron. Syst., Leibniz Univ., Hanover, Germany
fYear :
2007
fDate :
July 29 2007-Aug. 1 2007
Firstpage :
327
Lastpage :
329
Abstract :
Performance measurement is emerging as a significant utility in order to maintain and improve competitive advantages. With an all-embracing system, the management gets a multidimensional view to most relevant factors of the business process. In this paper, we discuss an approach of building up a framework for measuring the performance of semiconductor design projects. For this purpose, three established approaches, the Balanced Scorecard, the European Foundation for Quality Management Excellence Model and the Retail Performance Management System are presented and discussed in relation to our approach. Furthermore, proposals for future research are given.
Keywords :
design engineering; performance index; production; quality management; semiconductor industry; balanced scorecard; performance measurement system; productivity metrics; quality management excellence model; retail performance management system; semiconductor design projects; Control systems; Financial management; Multidimensional systems; Process design; Productivity; Proposals; Quality management; Semiconductor device measurement; Technological innovation; Total quality management; Performance Indicators; Performance Measurement; Productivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering Management Conference, 2007 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2145-9
Electronic_ISBN :
978-1-4244-2146-6
Type :
conf
DOI :
10.1109/IEMC.2007.5235054
Filename :
5235054
Link To Document :
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