• DocumentCode
    3320720
  • Title

    Cyclic stress-strain measurement tests of Sn3.5Ag0.75Cu solder joint

  • Author

    Park, Tae-Sang ; Lee, Soon-Bok

  • Author_Institution
    Dept. of Mech. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • fYear
    2002
  • fDate
    4-6 Dec. 2002
  • Firstpage
    317
  • Lastpage
    323
  • Abstract
    For an accurate measurement of the material behavior of solder joints, a test method was established to calibrate the machine stiffness. Also another new optical experimental technique to measure the deformation across a solder joint is proposed. The test method uses the dual microscope that can measure the relative deformation of two adjacent regions. The magnified view is captured by CCD cameras and the relative deformation can be measured by the pattern matching and tracing method Several cyclic tests of the Sn3.5Ag0.75Cu were carried out under force control, displacement control and monotonic creep. The Ramberg-Osgood model and a primary secondary creep model were adopted to predict the cyclic behavior during cyclic displacement loading conditions.
  • Keywords
    calibration; copper alloys; creep; deformation; mechanical testing; packaging; silver alloys; soldering; strain measurement; stress measurement; tin alloys; Ramberg-Osgood model; Sn3.5Ag0.75Cu solder joint; SnAgCu; cyclic behavior prediction; cyclic displacement loading conditions; cyclic stress-strain measurement tests; cyclic tests; deformation measurement; displacement control; dual microscope; force control; interconnection technology; machine stiffness; microelectronic packaging; micromechanical testing system; monotonic creep; optical experimental technique; pattern matching; primary secondary creep model; solder joint material behavior; tracing method; Charge coupled devices; Charge-coupled image sensors; Creep; Joining materials; Materials testing; Microscopy; Optical materials; Predictive models; Soldering; Stress measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2002. Proceedings of the 4th International Symposium on
  • Print_ISBN
    0-7803-7682-X
  • Type

    conf

  • DOI
    10.1109/EMAP.2002.1188858
  • Filename
    1188858