DocumentCode
3320720
Title
Cyclic stress-strain measurement tests of Sn3.5Ag0.75Cu solder joint
Author
Park, Tae-Sang ; Lee, Soon-Bok
Author_Institution
Dept. of Mech. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fYear
2002
fDate
4-6 Dec. 2002
Firstpage
317
Lastpage
323
Abstract
For an accurate measurement of the material behavior of solder joints, a test method was established to calibrate the machine stiffness. Also another new optical experimental technique to measure the deformation across a solder joint is proposed. The test method uses the dual microscope that can measure the relative deformation of two adjacent regions. The magnified view is captured by CCD cameras and the relative deformation can be measured by the pattern matching and tracing method Several cyclic tests of the Sn3.5Ag0.75Cu were carried out under force control, displacement control and monotonic creep. The Ramberg-Osgood model and a primary secondary creep model were adopted to predict the cyclic behavior during cyclic displacement loading conditions.
Keywords
calibration; copper alloys; creep; deformation; mechanical testing; packaging; silver alloys; soldering; strain measurement; stress measurement; tin alloys; Ramberg-Osgood model; Sn3.5Ag0.75Cu solder joint; SnAgCu; cyclic behavior prediction; cyclic displacement loading conditions; cyclic stress-strain measurement tests; cyclic tests; deformation measurement; displacement control; dual microscope; force control; interconnection technology; machine stiffness; microelectronic packaging; micromechanical testing system; monotonic creep; optical experimental technique; pattern matching; primary secondary creep model; solder joint material behavior; tracing method; Charge coupled devices; Charge-coupled image sensors; Creep; Joining materials; Materials testing; Microscopy; Optical materials; Predictive models; Soldering; Stress measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Materials and Packaging, 2002. Proceedings of the 4th International Symposium on
Print_ISBN
0-7803-7682-X
Type
conf
DOI
10.1109/EMAP.2002.1188858
Filename
1188858
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