DocumentCode
3320902
Title
Environmental friendly CSP
Author
Chung, C.L. ; Kao, Penny ; Fu, S.L. ; Chou, Steven ; Lu, Alex ; Tsai, R.B. ; Lee, Y.J. ; Huang, M.L. ; Ku, Peter
Author_Institution
Dept. of Mater. Sci. & Eng., I-Shou Univ., Kaohsiung, Taiwan
fYear
2002
fDate
4-6 Dec. 2002
Firstpage
377
Lastpage
380
Abstract
In this paper, the study on the relationship between green assembly material properties and failure mechanism of moisture sensitivity reliability are reported. It focuses on the JEDEC level 2 and 3 precondition conditions that are 85°C, 60%RH for 168hrs and 30°C, 60RH% for 192 hrs, respectively. Besides, the paper discusses the process parameters and relative material influences. For instance, package block warpage and compound moisture absorption effects. Cure kinetic and thermal resistances of the green compound were analyzed by differential scanning calorimetry (DSC) and thermo gravimetric analysis (TGA), respectively. On the surfaces of delamination of reliability test specimens, which are analysis by scanning electron microscope (SEM) and scanning acoustic tomograph (SAT). The remainder flux amount at melt range of lead free solder affects circularity of solder ball dramatically. Furthermore, block warpage and moisture sensitivity reliability results reveal some conflict between process and reliability request. The compound with higher filler content relatively with less resin ratio exhibits larger block warpage and lower moisture uptake, respectively. That conducts poor facility during process and good performances in reliability test.
Keywords
chip scale packaging; differential scanning calorimetry; environmental degradation; environmental factors; failure analysis; reliability; scanning electron microscopy; soldering; thermal analysis; thermal resistance; 30 degC; 85 degC; block warpage; chip scale package; cure kinetics; differential scanning calorimetry; environmental friendliness; failure mechanism; filler content; green compound; lead-free solder ball; moisture absorption; moisture sensitivity reliability; scanning acoustic tomography; scanning electron microscopy; thermal resistance; thermogravimetric analysis; Absorption; Assembly; Failure analysis; Kinetic theory; Material properties; Materials reliability; Moisture; Packaging; Scanning electron microscopy; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Materials and Packaging, 2002. Proceedings of the 4th International Symposium on
Print_ISBN
0-7803-7682-X
Type
conf
DOI
10.1109/EMAP.2002.1188868
Filename
1188868
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