Title :
A robust super-resolution approach with sparsity constraint for near-field wideband acoustic imaging
Author :
Chu, Ning ; Picheral, José ; Mohammad-djafari, Ali
Author_Institution :
Lab. des Signaux et Syst. (L2S), SUPELEC-PARIS SUD, Gif-sur-Yvette, France
Abstract :
Acoustic source imaging has nowadays been widely used in source localization and separation. In this paper, based on the deconvolution methods (DAMAS), we propose a robust super-resolution approach with sparsity constraint (SC-RDAMAS) to estimate both the positions and powers of the sources, as well as the noise variance in low Signal to Noise Ratio (SNR) situation. For effectively applying sparsity constraint, we explore a better initialization of source number to determine the bound of total source powers. By simulations and real data, we show that our SC-RDAMAS can obtain more accurate estimations of source positions and averaging powers, and can be more robust to strong noise interference, by comparison with the state of the art methods: the Beamforming, DAMAS, DAMAS with sparsity constraint (SC-DAMAS) and the Covariance Matrix Fitting (CMF) method. Indeed the computation burden of the proposed method is much lower than the CMF, so that our SC-RDAMAS is more applicable to scan the large region with super resolutions.
Keywords :
acoustic imaging; acoustic noise; acoustic radiators; acoustic signal processing; acoustic wave interference; deconvolution; source separation; DAMAS method; SC-RDAMAS; SNR; acoustic source imaging; bound determination; deconvolution methods; near-field wideband acoustic imaging; noise interference; noise variance; position estimation; robust super-resolution approach; signal to noise ratio; source localization; source number initialization; source power estimation; source separation; sparsity constraint; Image resolution; Imaging; Noise; Signal resolution; Tin;
Conference_Titel :
Signal Processing and Information Technology (ISSPIT), 2011 IEEE International Symposium on
Conference_Location :
Bilbao
Print_ISBN :
978-1-4673-0752-9
Electronic_ISBN :
978-1-4673-0751-2
DOI :
10.1109/ISSPIT.2011.6151579