• DocumentCode
    3321201
  • Title

    System-level modeling and experimental verification for the CMOS MEMS microphone

  • Author

    Wang, Di-Bao ; Lee, Hsin-Li ; Chang, Pin

  • Author_Institution
    Microsyst. Technol. Center, Ind. Technol. Res. Inst., Tainan, Taiwan
  • Volume
    2
  • fYear
    2010
  • fDate
    5-7 May 2010
  • Firstpage
    245
  • Lastpage
    248
  • Abstract
    A MEMS microphone system consists of subsystems such as chamber acoustics, structural dynamics, capacitor electrostatics and read-out circuitry. No matter fabricating the whole system with SoC (system on chip) by CMOS process or with SiP (system in packaging), the capability of system-level modeling is the prerequisite to design a microphone with high performances. Unlike using circuit analogy in published studies, this research builds all subsystems with SIMULINK® platform on a signal-flow base, which promises not only the nonlinear interactions between subsystems but also a deeply physical insight into the design investigation. Compared with experimental measurement, this modeling shows good agreement and can catch important features in frequency response such as circuit-induced low-frequency decaying and packaging-induced Helmholtz´s resonance.
  • Keywords
    CMOS integrated circuits; digital simulation; electronic engineering computing; electrostatics; micromechanical devices; microphones; system-in-package; system-on-chip; CMOS MEMS microphone; CMOS process; Simulink; capacitor electrostatics; chamber acoustics; experimental verification; packaging induced Helmholtz resonance; read out circuitry; signal flow base; structural dynamics; system in packaging; system level modeling; system on chip; Acoustics; CMOS process; Capacitors; Circuits; Electrostatics; Micromechanical devices; Microphones; Packaging; Semiconductor device modeling; System-on-a-chip; MEMS Microphone; acoustics; modeling; system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Communication Control and Automation (3CA), 2010 International Symposium on
  • Conference_Location
    Tainan
  • Print_ISBN
    978-1-4244-5565-2
  • Type

    conf

  • DOI
    10.1109/3CA.2010.5533547
  • Filename
    5533547