• DocumentCode
    3321378
  • Title

    Architectural Comparison of Analog and Digital Duty Cycle Corrector for High Speed I/O Link

  • Author

    Raghavan, Leneesh ; Wu, Ting

  • Author_Institution
    Rambus Inc., Bangalore, India
  • fYear
    2010
  • fDate
    3-7 Jan. 2010
  • Firstpage
    270
  • Lastpage
    275
  • Abstract
    To achieve high speed data signaling rates with the internal fast clock operating at half its speed,the XDR (extreme data rate) I/O link employs dual-edge signaling where in data bits are transmitted on both the edges (rise/fall) of transmit clock. Duty cycle correction technique is used to provide high frequency low jitter clocks that have 50% duty cycle. This paper compares two different techniques to implement duty cycle corrector (DCC). These techniques are implemented in high speed I/O operating at data rate of 4Gbps and 6.4Gbps in TSMC 65nm & TSMC 40nm technology achieving an output duty cycle error below ±2% for ±10% input duty cycle error.
  • Keywords
    clocks; jitter; TSMC; analog duty cycle corrector; data bits; digital duty cycle corrector; dual-edge signaling; duty cycle correction technique; duty cycle error; extreme data rate; high speed I/O link; high speed data signaling rate; jitter clock; transmit clock; Circuits; Clocks; Data communication; Digital control; Error correction; Frequency; Jitter; Signal design; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2010. VLSID '10. 23rd International Conference on
  • Conference_Location
    Bangalore
  • ISSN
    1063-9667
  • Print_ISBN
    978-1-4244-5541-6
  • Type

    conf

  • DOI
    10.1109/VLSI.Design.2010.83
  • Filename
    5401327